X. Xhafa, Aymen Ladhar, Eric Faehn, Lorena Anghel, G. di Pendina, Patrick Girard 0001, Arnaud Virazel. On Using Cell-Aware Methodology for SRAM Bit Cell Testing. In IEEE European Test Symposium, ETS 2023, Venezia, Italy, May 22-26, 2023. pages 1-4, IEEE, 2023. [doi]
Abstract is missing.