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On Using Cell-Aware Methodology for SRAM Bit Cell Testing

X. Xhafa, Aymen Ladhar, Eric Faehn, Lorena Anghel, G. di Pendina, Patrick Girard 0001, Arnaud Virazel. On Using Cell-Aware Methodology for SRAM Bit Cell Testing. In IEEE European Test Symposium, ETS 2023, Venezia, Italy, May 22-26, 2023. pages 1-4, IEEE, 2023. [doi]

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X. Xhafa

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Aymen Ladhar

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Eric Faehn

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Lorena Anghel

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G. di Pendina

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Patrick Girard 0001

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Arnaud Virazel

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