X. Xhafa, Aymen Ladhar, Eric Faehn, Lorena Anghel, G. di Pendina, Patrick Girard 0001, Arnaud Virazel. On Using Cell-Aware Methodology for SRAM Bit Cell Testing. In IEEE European Test Symposium, ETS 2023, Venezia, Italy, May 22-26, 2023. pages 1-4, IEEE, 2023. [doi]
@inproceedings{XhafaLFAPGV23,
title = {On Using Cell-Aware Methodology for SRAM Bit Cell Testing},
author = {X. Xhafa and Aymen Ladhar and Eric Faehn and Lorena Anghel and G. di Pendina and Patrick Girard 0001 and Arnaud Virazel},
year = {2023},
doi = {10.1109/ETS56758.2023.10174118},
url = {https://doi.org/10.1109/ETS56758.2023.10174118},
researchr = {https://researchr.org/publication/XhafaLFAPGV23},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE European Test Symposium, ETS 2023, Venezia, Italy, May 22-26, 2023},
publisher = {IEEE},
isbn = {979-8-3503-3634-4},
}