P. Girard - researchr alias

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Viewing Publication 1 - 21 from 21

2023

Predictor BIST: An "All-in-One" Optical Test Solution for CMOS Image SensorsJ. Lefevre, P. Debaud, P. Girard, Arnaud Virazel. itc 2023: 310-319 [doi]

2022

A Comprehensive Learning-Based Flow for Cell-Aware Model GenerationP. d'Hondt, A. Ladhar, P. Girard, Arnaud Virazel. itc 2022: 484-488 [doi]

2021

2020

2019

A Capacitor-Less CMOS Neuron Circuit for Neuromemristive NetworksHassen Aziza, M. Moreau, A. Perez, Arnaud Virazel, P. Girard. newcas 2019: 1-4 [doi]

Towards Improvement of Mission Mode Failure Diagnosis for System-on-ChipS. Mhamdi, Arnaud Virazel, P. Girard, Alberto Bosio, Etienne Auvray, E. Faehn, A. Ladhar. iolts 2019: 21-26 [doi]

2018

Is aproximate computing suitable for selective hardening of arithmetic circuits?Bastien Deveautour, Arnaud Virazel, P. Girard, Serge Pravossoudovitch, Valentin Gherman. dtis 2018: 1-6 [doi]

An Effective Intra-Cell Diagnosis Flow for Industrial SRAMsT.-P. Ho, E. Faehn, Arnaud Virazel, Alberto Bosio, P. Girard. itc 2018: 1-8 [doi]

2017

An effective fault-injection framework for memory reliability enhancement perspectivesG. Harcha, A. Bosio, P. Girard, Arnaud Virazel, Paolo Bernardi. dtis 2017: 1-6 [doi]

2015

An efficient hybrid power modeling approach for accurate gate-level power estimationAlejandro Nocua, Arnaud Virazel, Alberto Bosio, P. Girard, C. Chevalier. icm2 2015: 17-20 [doi]

2013

Characterization of an SRAM based particle detector for mixed-field radiation environmentsG. Tsiligiannis, Luigi Dilillo, Alberto Bosio, P. Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, J. Mekki, M. Brugger, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné. iwasi 2013: 75-80 [doi]

2007

From onions to broccoli: generalizing Lewis' counterfactual logicP. Girard. jancl, 17(2):213-229, 2007. [doi]

2003

Requirements for delay testing of look-up tables in SRAM-based FPGAsP. Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell. ets 2003: 147-152 [doi]

2001

On hardware generation of random single input change test sequencesRené David, P. Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel. ets 2001: 117-123 [doi]

2000

Delay fault testing: choosing between random SIC and random MIC test sequencesArnaud Virazel, René David, P. Girard, Christian Landrault, Serge Pravossoudovitch. ets 2000: 9-14 [doi]

1999

Low power BIST by filtering non-detecting vectorsSalvador Manich, A. Gabarró, M. Lopez, Joan Figueras, P. Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, P. Teixeira, Marcelino B. Santos. ets 1999: 165-170 [doi]

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