Table of Contents

• MBIST Support for Reliable eMRAM SensingJongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Cyrille Dray, El Mehdi Boujamaa. 1-6 [doi]
• Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical ApplicationsDaniel A. G. de Oliveira, Sean Blanchard, Nathan DeBardeleben, Fernando F. Dos Santos, Gabriel Piscoya Dávila, Philippe O. A. Navaux, Carlo Cazzaniga, Christopher Frost, Robert C. Baumann, Paolo Rech. 1-6 [doi]
• Test Sequence-Optimized BIST for Automotive ApplicationsBartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Lukasz Rybak, Jerzy Tyszer. 1-6 [doi]
• Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designsFelipe Augusto da Silva, Ahmet Cagri Bagbaba, Sandro Sartoni, Riccardo Cantoro, Matteo Sonza Reorda, Said Hamdioui, Christian Sauer 0001. 1-6 [doi]
• IEEE Std. P1687.1 for Access Control of Reconfigurable Scan NetworksErik Larsson, Zehang Xiang, Prathamesh Murali. 1-2 [doi]
• QAMR: an Approximation-Based Fully Reliable TMR Alternative for Area Overhead ReductionBastien Deveautour, Marcello Traiola, Arnaud Virazel, P. Girard. 1-6 [doi]
• Latent Defect Screening with Visually-Enhanced Dynamic Part Average TestingAnthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen. 1-6 [doi]
• Dynamic Authentication-Based Secure Access to Test InfrastructureMichele Portolan, Vincent Reynaud, Paolo Maistri, Régis Leveugle. 1-6 [doi]
• The Risk of Outsourcing: Hidden SCA Trojans in Third-Party IP-Cores Threaten Cryptographic ICsDavid Knichel, Thorben Moos, Amir Moradi 0001. 1-6 [doi]
• Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate StatisticsNektar Xama, Jakob Raymaekers, Martin Andraud, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen. 1-6 [doi]
• Nonlinear Codes for Control Flow CheckingGiorgio Di Natale, Osnat Keren. 1-6 [doi]
• Learning-Based Cell-Aware Defect Diagnosis of Customer ReturnsS. Mhamdi, P. Girard, Arnaud Virazel, Alberto Bosio, A. Ladhar. 1-2 [doi]
• Linking Chip, Board, and System Test via StandardsMichele Portolan, Jeff Rearick, Martin Keim. 1-8 [doi]
• Hardware Trojan Attacks in Analog/Mixed-Signal ICs via the Test Access MechanismMohamed Elshamy, Giorgio Di Natale, Antonios Pavlidis, Marie-Minerve Louërat, Haralampos-G. D. Stratigopoulos. 1-6 [doi]
• Detection of Rowhammer Attacks in SoCs with FPGAsRana Elnaggar, Siyuan Chen, Peilin Song, Krishnendu Chakrabarty. 1-2 [doi]
• Built-In Predictors for Dynamic Crosstalk AvoidanceRezgar Sadeghi, Zainalabedin Navabi. 1-6 [doi]
• Automated Graph-Based Fault Injection Into Virtual Prototypes for Robustness EvaluationJo Laufenberg, Thomas Kropf, Oliver Bringmann 0001. 1-2 [doi]
• Monitoring of BTI and HCI Aging in SRAM DecodersHelen-Maria Dounavi, Yiorgos Tsiatouhas. 1-2 [doi]
• G-PUF: An Intrinsic PUF Based on GPU Error SignaturesBruno Forlin, Ronaldo Husemann, Luigi Carro, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil. 1-2 [doi]
• Anomaly Detection in Embedded Systems Using Power and Memory Side ChannelsJiho Park, Virinchi Roy Surabhi, Prashanth Krishnamurthy, Siddharth Garg, Ramesh Karri, Farshad Khorrami. 1-2 [doi]
• cm-based switching SAR ADCs using an incremental analog-to-digital converterRenato S. Feitoza, Manuel J. Barragan, Antonio J. Ginés, Salvador Mir. 1-2 [doi]
• Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB LevelLizhou Wu, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui. 1-2 [doi]
• A Built-In Self-Test Method For MEMS Piezoresistive SensorManhong Zhu, Jia Li, Weibing Wang, Dapeng Chen. 1-6 [doi]
• Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest FaultsMin-Chun Hu, Zhan Gao, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Cheng-Wen Wu, Erik Jan Marinissen. 1-6 [doi]
• Variation-Aware Defect Characterization at Cell LevelZahra Paria Najafi-Haghi, Marzieh Hashemipour-Nazari, Hans-Joachim Wunderlich. 1-6 [doi]
• Digital Defect Based Built-in Self-Test for Low Dropout Voltage RegulatorsMehmet Ince, Sule Ozev. 1-2 [doi]
• PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning TechniquesKatherine Shu-Min Li, Peter Yi-Yu Liao, Leon Chou, Ken Chau-Cheung Cheng, Andrew Yi-Ann Huang, Sying-Jyan Wang, Gus Chang-Hung Han. 1-6 [doi]
• Efficient Prognostication of Pattern Count with Different Input Compression RatiosFong-Jyun Tsai, Chong-Siao Ye, Yu Huang 0005, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski. 1-2 [doi]
• Accurate Measurements of Small Resistances in Vertical Interconnects with Small Aspect RatiosMichele Stucchi, Ferenc Fodor, Erik Jan Marinissen. 1-6 [doi]
• Analog Fault Simulation - a Hot Topic!Stephen Sunter. 1-5 [doi]
• Design, Verification, Test and In-Field Implications of Approximate Computing SystemsAlberto Bosio, S. Di Carlo, P. Girard, E. Sanchez, Alessandro Savino, Lukás Sekanina, Marcello Traiola, Zdenek Vasícek, Arnaud Virazel. 1-10 [doi]
• Failure and Attack Detection by Digital SensorsMd Toufiq Hasan Anik, Rachit Saini, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi. 1-2 [doi]
• A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC VerificationAndrei Gaita, Georgian Nicolae, Emilian C. David, Andi Buzo, Corneliu Burileanu, Georg Pelz. 1-2 [doi]
• A New Monitor Insertion Algorithm for Intermittent Fault DetectionHassan Ebrahimi, Hans G. Kerkhoff. 1-6 [doi]
• Minimal Witnesses for Security Weaknesses in Reconfigurable Scan NetworksPascal Raiola, Tobias Paxian, Bernd Becker 0001. 1-6 [doi]
• PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test CommunityAmir Alipour, Vincent Beroulle, Bertrand Cambou, Jean-Luc Danger, Giorgio Di Natale, David Hély, Sylvain Guilley, Naghmeh Karimi. 1-10 [doi]
• Modeling Static Noise Margin for FinFET based SRAM PUFsShayesteh Masoumian, Georgios N. Selimis, Roel Maes, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil. 1-6 [doi]
• Testing Scouting Logic-Based Computation-in-Memory ArchitecturesMoritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi B. Tahoori, Mottaqiallah Taouil, Said Hamdioui. 1-6 [doi]
• LiD-CAT: A Lightweight Detector for Cache ATtacksCezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil, Behrad Niazmand, Tara Ghasempouri, Jaan Raik, Johanna Sepúlveda. 1-6 [doi]
• Design Obfuscation versus TestFarimah Farahmandi, Ozgur Sinanoglu, Ronald D. Blanton, Samuel Pagliarini. 1-10 [doi]
• Functional-Like Transition Delay Fault Test-Pattern Generation using a Bayesian-Based Circuit ModelChing-Yuan Chen, Ching-Hong Cheng, Jiun-Lang Huang, Krishnendu Chakrabarty. 1-6 [doi]
• Defect Characterization and Test Generation for Spintronic-based Compute-In-MemorySarath Mohanachandran Nair, Christopher Münch, Mehdi Baradaran Tahoori. 1-6 [doi]