Sarath Mohanachandran Nair, Christopher Münch, Mehdi Baradaran Tahoori. Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory. In IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.