Ching-Yuan Chen, Ching-Hong Cheng, Jiun-Lang Huang, Krishnendu Chakrabarty. Functional-Like Transition Delay Fault Test-Pattern Generation using a Bayesian-Based Circuit Model. In IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.