Ching-Yuan Chen, Ching-Hong Cheng, Jiun-Lang Huang, Krishnendu Chakrabarty. Functional-Like Transition Delay Fault Test-Pattern Generation using a Bayesian-Based Circuit Model. In IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{ChenCHC20,
title = {Functional-Like Transition Delay Fault Test-Pattern Generation using a Bayesian-Based Circuit Model},
author = {Ching-Yuan Chen and Ching-Hong Cheng and Jiun-Lang Huang and Krishnendu Chakrabarty},
year = {2020},
doi = {10.1109/ETS48528.2020.9131591},
url = {https://doi.org/10.1109/ETS48528.2020.9131591},
researchr = {https://researchr.org/publication/ChenCHC20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020},
publisher = {IEEE},
isbn = {978-1-7281-4312-5},
}