Functional-Like Transition Delay Fault Test-Pattern Generation using a Bayesian-Based Circuit Model - researchr publication authors

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Ching-Yuan Chen, Ching-Hong Cheng, Jiun-Lang Huang, Krishnendu Chakrabarty. Functional-Like Transition Delay Fault Test-Pattern Generation using a Bayesian-Based Circuit Model. In IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020. pages 1-6, IEEE, 2020. [doi]

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