Zahra Paria Najafi-Haghi, Marzieh Hashemipour-Nazari, Hans-Joachim Wunderlich. Variation-Aware Defect Characterization at Cell Level. In IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.