Zahra Paria Najafi-Haghi, Marzieh Hashemipour-Nazari, Hans-Joachim Wunderlich. Variation-Aware Defect Characterization at Cell Level. In IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{Najafi-HaghiHW20,
title = {Variation-Aware Defect Characterization at Cell Level},
author = {Zahra Paria Najafi-Haghi and Marzieh Hashemipour-Nazari and Hans-Joachim Wunderlich},
year = {2020},
doi = {10.1109/ETS48528.2020.9131600},
url = {https://doi.org/10.1109/ETS48528.2020.9131600},
researchr = {https://researchr.org/publication/Najafi-HaghiHW20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020},
publisher = {IEEE},
isbn = {978-1-7281-4312-5},
}