Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators

Mehmet Ince, Sule Ozev. Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators. In IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020. pages 1-2, IEEE, 2020. [doi]

Abstract

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