Mehmet Ince, Sule Ozev. Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators. In IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020. pages 1-2, IEEE, 2020. [doi]
@inproceedings{InceO20,
title = {Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators},
author = {Mehmet Ince and Sule Ozev},
year = {2020},
doi = {10.1109/ETS48528.2020.9131577},
url = {https://doi.org/10.1109/ETS48528.2020.9131577},
researchr = {https://researchr.org/publication/InceO20},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020},
publisher = {IEEE},
isbn = {978-1-7281-4312-5},
}