Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Lukasz Rybak, Jerzy Tyszer. Test Sequence-Optimized BIST for Automotive Applications. In IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.