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Test Sequence-Optimized BIST for Automotive Applications

Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Lukasz Rybak, Jerzy Tyszer. Test Sequence-Optimized BIST for Automotive Applications. In IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020. pages 1-6, IEEE, 2020. [doi]

Authors

Bartosz Kaczmarek

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Grzegorz Mrugalski

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Nilanjan Mukherjee 0001

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Janusz Rajski

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Lukasz Rybak

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Jerzy Tyszer

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