Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Lukasz Rybak, Jerzy Tyszer. Test Sequence-Optimized BIST for Automotive Applications. In IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{KaczmarekM0RRT20,
title = {Test Sequence-Optimized BIST for Automotive Applications},
author = {Bartosz Kaczmarek and Grzegorz Mrugalski and Nilanjan Mukherjee 0001 and Janusz Rajski and Lukasz Rybak and Jerzy Tyszer},
year = {2020},
doi = {10.1109/ETS48528.2020.9131585},
url = {https://doi.org/10.1109/ETS48528.2020.9131585},
researchr = {https://researchr.org/publication/KaczmarekM0RRT20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020},
publisher = {IEEE},
isbn = {978-1-7281-4312-5},
}