Lizhou Wu, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui. Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level. In IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020. pages 1-2, IEEE, 2020. [doi]
Abstract is missing.