An effective fault-injection framework for memory reliability enhancement perspectives

G. Harcha, A. Bosio, P. Girard, Arnaud Virazel, Paolo Bernardi. An effective fault-injection framework for memory reliability enhancement perspectives. In 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, DTIS 2017, Palma de Mallorca, Spain, April 4-6, 2017. pages 1-6, IEEE, 2017. [doi]

Abstract

Abstract is missing.