G. Harcha, A. Bosio, P. Girard, Arnaud Virazel, Paolo Bernardi. An effective fault-injection framework for memory reliability enhancement perspectives. In 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, DTIS 2017, Palma de Mallorca, Spain, April 4-6, 2017. pages 1-6, IEEE, 2017. [doi]
@inproceedings{HarchaBGVB17,
title = {An effective fault-injection framework for memory reliability enhancement perspectives},
author = {G. Harcha and A. Bosio and P. Girard and Arnaud Virazel and Paolo Bernardi},
year = {2017},
doi = {10.1109/DTIS.2017.7930172},
url = {https://doi.org/10.1109/DTIS.2017.7930172},
researchr = {https://researchr.org/publication/HarchaBGVB17},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, DTIS 2017, Palma de Mallorca, Spain, April 4-6, 2017},
publisher = {IEEE},
isbn = {978-1-5090-6377-2},
}