Arnaud Virazel, René David, P. Girard, Christian Landrault, Serge Pravossoudovitch. Delay fault testing: choosing between random SIC and random MIC test sequences. In 5th European Test Workshop, ETW 2000, Cascais, Portugal, May 23-26, 2000. pages 9-14, IEEE Computer Society, 2000. [doi]
Abstract is missing.