Arnaud Virazel, René David, P. Girard, Christian Landrault, Serge Pravossoudovitch. Delay fault testing: choosing between random SIC and random MIC test sequences. In 5th European Test Workshop, ETW 2000, Cascais, Portugal, May 23-26, 2000. pages 9-14, IEEE Computer Society, 2000. [doi]
@inproceedings{VirazelDGLP00,
title = {Delay fault testing: choosing between random SIC and random MIC test sequences},
author = {Arnaud Virazel and René David and P. Girard and Christian Landrault and Serge Pravossoudovitch},
year = {2000},
doi = {10.1109/ETW.2000.873772},
url = {https://doi.org/10.1109/ETW.2000.873772},
researchr = {https://researchr.org/publication/VirazelDGLP00},
cites = {0},
citedby = {0},
pages = {9-14},
booktitle = {5th European Test Workshop, ETW 2000, Cascais, Portugal, May 23-26, 2000},
publisher = {IEEE Computer Society},
isbn = {0-7695-0701-8},
}