Atomic force microscopy-based single-cell indentation: Experimentation and finite element simulation

Hamid Ladjal, Jean-Luc Hanus, Anand Pillarisetti, Carol Keefer, Antoine Ferreira, Jaydev P. Desai. Atomic force microscopy-based single-cell indentation: Experimentation and finite element simulation. In 2009 IEEE/RSJ International Conference on Intelligent Robots and Systems, October 11-15, 2009, St. Louis, MO, USA. pages 1326-1332, IEEE, 2009. [doi]

Abstract

Abstract is missing.