Evaluation Methodology for Single Electron Encoded Threshold Logic Gates

Casper Lageweg, Sorin Cotofana, Stamatis Vassiliadis. Evaluation Methodology for Single Electron Encoded Threshold Logic Gates. In Manfred Glesner, Ricardo Augusto da Luz Reis, Hans Eveking, Vincent John Mooney III, Leandro Soares Indrusiak, Peter Zipf, editors, IFIP VLSI-SoC 2003, IFIP WG 10.5 International Conference on Very Large Scale Integration of System-on-Chip, Darmstadt, Germany, 1-3 December 2003. pages 258-262, Technische Universität Darmstadt, Insitute of Microelectronic Systems, 2003.

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