Ignacio Laguna, Subrata Mitra, Fahad A. Arshad, Nawanol Theera-Ampornpunt, Zongyang Zhu, Saurabh Bagchi, Samuel P. Midkiff, Michael Kistler, Ahmed Gheith. Automatic Problem Localization via Multi-dimensional Metric Profiling. In IEEE 32nd Symposium on Reliable Distributed Systems, SRDS 2013, Braga, Portugal, 1-3 October 2013. pages 121-132, IEEE, 2013. [doi]
Abstract is missing.