Khitem Lahbacha, Giulia Di Capua, Gianfranco Miele, Antonio Maffucci, Andrea Gaetano Chiariello, Thi Dao Pham, Djamel Allal. Measurement-Based Signal Integrity Analysis of Coupled Thin-Film Microstrip Lines. In 2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy, July 2-5, 2024. pages 1-6, IEEE, 2024. [doi]
Abstract is missing.