ESD Capability Analysis of High-voltage nLDMOSs by the Bulk Terminal Modulation

Jhong-Yi Lai, Shen-Li Chen, Zhi-Wei Liu, Xing-Chen Mai, Yu-Jie Chung. ESD Capability Analysis of High-voltage nLDMOSs by the Bulk Terminal Modulation. In IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2022, Taipei, Taiwan, July 6-8, 2022. pages 71-72, IEEE, 2022. [doi]

Abstract

Abstract is missing.