Time-Varying Cumulative Damage Recursive Method for Power Semiconductor Devices

Wei Lai, Hanrui Li, Hui Li, Minyou Chen, Ran Yao, Hongjian Xia, Renkuai Liu, Anbin Liu. Time-Varying Cumulative Damage Recursive Method for Power Semiconductor Devices. IEEE Transactions on Industrial Electronics, 70(12):12795-12805, 2023. [doi]

Abstract

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