Weiwei Lai, Wing W. Y. Ng, Patrick P. K. Chan, Daniel S. Yeung. Trademark classification by shape using ensemble of RBFNNs. In International Conference on Machine Learning and Cybernetics, ICMLC 2010, Qingdao, China, July 11-14, 2010, Proceedings. pages 391-396, IEEE, 2010. [doi]
Abstract is missing.