Mike Laisne. Advanced methods for leveraging new test standards. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 97, IEEE Computer Society, 2011. [doi]
@inproceedings{Laisne11,
title = {Advanced methods for leveraging new test standards},
author = {Mike Laisne},
year = {2011},
doi = {10.1109/VTS.2011.5783758},
url = {http://dx.doi.org/10.1109/VTS.2011.5783758},
researchr = {https://researchr.org/publication/Laisne11},
cites = {0},
citedby = {0},
pages = {97},
booktitle = {29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA},
publisher = {IEEE Computer Society},
}