Sampling Biases in IP Topology Measurements

Anukool Lakhina, John W. Byers, Mark Crovella, Peng Xie. Sampling Biases in IP Topology Measurements. In INFOCOM. pages 332-341, 2003. [doi]

Authors

Anukool Lakhina

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John W. Byers

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Mark Crovella

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Peng Xie

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