Sampling Biases in IP Topology Measurements - researchr publication bibtex

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Anukool Lakhina, John W. Byers, Mark Crovella, Peng Xie. Sampling Biases in IP Topology Measurements. In INFOCOM. pages 332-341, 2003. [doi]

@inproceedings{LakhinaBCX03,
  title = {Sampling Biases in IP Topology Measurements},
  author = {Anukool Lakhina and John W. Byers and Mark Crovella and Peng Xie},
  year = {2003},
  url = {http://www.ieee-infocom.org/2003/papers/09_01.PDF},
  researchr = {https://researchr.org/publication/LakhinaBCX03},
  cites = {0},
  citedby = {0},
  pages = {332-341},
  booktitle = {INFOCOM},
}

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