Ahmed Lakhssassi, Roman Palenychka, Michel Sayde, Yvon Savaria, Marek B. Zaremba, Emmanuel Kengne. A spatiotemporal attention operator for monitoring thermo-mechanical stress in wafer-scale integrated circuits using an infrared camera. In 8th International Symposium on Image and Signal Processing and Analysis, ISPA 2013, Trieste, Italy, September 4-6, 2013. pages 165-170, IEEE, 2013. [doi]
Abstract is missing.