A Programmable Window Comparator for Analog Online Testing

Amit Laknaur, Rui Xiao, Haibo Wang. A Programmable Window Comparator for Analog Online Testing. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 119-124, IEEE Computer Society, 2007. [doi]

Authors

Amit Laknaur

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Rui Xiao

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Haibo Wang

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