S. Lakshmi, V. Sankaranarayanan. Robust Key Points Matching by Ordinal Measure. In Tai-Hoon Kim, Hojjat Adeli, Carlos Ramos, Byeong Ho Kang, editors, Signal Processing, Image Processing and Pattern Recognition - International Conference, SIP 2011, Held as Part of the Future Generation Information Technology Conference FGIT 2011, in Conjunction with GDC 2011, Jeju Island, Korea, December 8-10, 2011. Proceedings. Volume 260 of Communications in Computer and Information Science, pages 346-355, Springer, 2011. [doi]
Abstract is missing.