An approach for designing self-checking logic using residue codes

Parag K. Lala, Fadi Y. Busaba, K. C. Yarlagadda. An approach for designing self-checking logic using residue codes. In 9th IEEE VLSI Test Symposium (VTS'91), 15-17 Apr 1991, Atlantic City, NJ, USA. pages 166-171, IEEE, 1991. [doi]

Abstract

Abstract is missing.