The following publications are possibly variants of this publication:
- Prognostication of Residual Life and Latent Damage Assessment in Lead-Free Electronics Under Thermomechanical LoadsPradeep Lall, Chandan Bhat, Madhura Hande, Vikrant More, Rahul Vaidya, Kai Goebel. tie, 58(7):2605-2616, 2011. [doi]
- Prognostication of system-state in lead-free electronics equipment under cyclic and steady-state thermo-mechanical loadsPradeep Lall, Madhura Hande, Chandan Bhat, Vikrant More, Rahul Vaidya. mr, 49(8):825-838, 2009. [doi]
- Technology Review: Image Enhancement, Feature Extraction and Template Protection of a Fingerprint Authentication SystemMd. Rajibul Islam, Md. Shohel Sayeed and Andrews Samraj. , 2010. [doi]