Beatriz Pérez Lamancha, Macario Polo Usaola. Testing Product Generation in Software Product Lines Using Pairwise for Features Coverage. In Alexandre Petrenko, Adenilso da Silva Simão, José Carlos Maldonado, editors, Testing Software and Systems - 22nd IFIP WG 6.1 International Conference, ICTSS 2010, Natal, Brazil, November 8-10, 2010. Proceedings. Volume 6435 of Lecture Notes in Computer Science, pages 111-125, Springer, 2010. [doi]
Abstract is missing.