Reliability of high voltage/high power L/S-band Hbt technology

B. Lambert, G. Jonsson, J. Bataille, C. Ollivier, P. Mezenge, H. Derewonko, H. Thomas, D. Floriot, H. Blanck, C. Moreau. Reliability of high voltage/high power L/S-band Hbt technology. Microelectronics Reliability, 50(9-11):1543-1547, 2010. [doi]

Abstract

Abstract is missing.