Reliability data's of 0.5 μm AlGaN/GaN on SiC technology qualification

B. Lambert, J. Thorpe, R. Behtash, B. Schauwecker, F. Bourgeois, H. Jung, J. Bataille, P. Mezenge, C. Gourdon, C. Ollivier, D. Floriot, H. Blanck. Reliability data's of 0.5 μm AlGaN/GaN on SiC technology qualification. Microelectronics Reliability, 52(9-10):2200-2204, 2012. [doi]

Abstract

Abstract is missing.