REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations - researchr publication authors

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Charles Lamech, Jim Aarestad, Jim Plusquellic, Reza M. Rad, Kanak Agarwal. REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations. In 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), San Jose, California, USA, November 7-10, 2011. pages 170-177, IEEE, 2011. [doi]

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