Active contour detection of linear patterns in spectrogram images

Thomas Andrew Lampert, Simon O Keefe. Active contour detection of linear patterns in spectrogram images. In 19th International Conference on Pattern Recognition (ICPR 2008), December 8-11, 2008, Tampa, Florida, USA. pages 1-4, IEEE, 2008. [doi]

Authors

Thomas Andrew Lampert

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Simon O Keefe

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