Application of Bayesian neural network in electrical impedance tomography

Jouko Lampinen, Aki Vehtari, Kimmo Leinonen. Application of Bayesian neural network in electrical impedance tomography. In International Joint Conference Neural Networks, IJCNN 1999, Washington, DC, USA, July 10-16, 1999. pages 3942-3947, IEEE, 1999. [doi]

Abstract

Abstract is missing.