Wenwei Lan, Zhanqi Cui, Jiaming Zhang, Jun Yang, Xiguo Gu. Fuzz Testing Based on Seed Diversity Analysis. In IEEE International Conference on Systems, Man, and Cybernetics, SMC 2023, Honolulu, Oahu, HI, USA, October 1-4, 2023. pages 145-150, IEEE, 2023. [doi]
Abstract is missing.