An edge-located uniform pattern recovery mechanism using statistical feature-based optimal center pixel selection strategy for local binary pattern

Shaokun Lan, Hongcheng Fan, Shiqi Hu, Xincheng Ren, Xuewen Liao, Zhibin Pan. An edge-located uniform pattern recovery mechanism using statistical feature-based optimal center pixel selection strategy for local binary pattern. Expert Syst. Appl., 221:119763, July 2023. [doi]

Authors

Shaokun Lan

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Hongcheng Fan

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Shiqi Hu

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Xincheng Ren

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Xuewen Liao

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Zhibin Pan

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