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An edge-located uniform pattern recovery mechanism using statistical feature-based optimal center pixel selection strategy for local binary pattern

Shaokun Lan, Hongcheng Fan, Shiqi Hu, Xincheng Ren, Xuewen Liao, Zhibin Pan. An edge-located uniform pattern recovery mechanism using statistical feature-based optimal center pixel selection strategy for local binary pattern. Expert Syst. Appl., 221:119763, July 2023. [doi]

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