Modeling NaTech-related domino effects in process clusters: A network-based approach

Meng Lan, Paolo Gardoni, Rongshui Qin, Xiao Zhang, Jiping Zhu, Siuming Lo. Modeling NaTech-related domino effects in process clusters: A network-based approach. Rel. Eng. & Sys. Safety, 221:108329, 2022. [doi]

Abstract

Abstract is missing.