A Test Path Generation Method Based on SSM Models - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Hao Lan, Yin Tong, Jin Guo, Yadong Zhang, Yao Li, Chang Rao. A Test Path Generation Method Based on SSM Models. In 2018 IEEE International Conference on Software Quality, Reliability and Security Companion, QRS Companion 2018, Lisbon, Portugal, July 16-20, 2018. pages 215-220, IEEE, 2018. [doi]

This author has not been identified. Look up 'Hao Lan' in GoogleThis author has not been identified. Look up 'Yin Tong' in GoogleThis author has not been identified. Look up 'Jin Guo' in GoogleThis author has not been identified. Look up 'Yadong Zhang' in GoogleThis author has not been identified. Look up 'Yao Li' in GoogleThis author has not been identified. Look up 'Chang Rao' in Google

runs on WebDSL