Hao Lan, Yin Tong, Jin Guo, Yadong Zhang, Yao Li, Chang Rao. A Test Path Generation Method Based on SSM Models. In 2018 IEEE International Conference on Software Quality, Reliability and Security Companion, QRS Companion 2018, Lisbon, Portugal, July 16-20, 2018. pages 215-220, IEEE, 2018. [doi]
@inproceedings{LanTGZLR18,
title = {A Test Path Generation Method Based on SSM Models},
author = {Hao Lan and Yin Tong and Jin Guo and Yadong Zhang and Yao Li and Chang Rao},
year = {2018},
doi = {10.1109/QRS-C.2018.00048},
url = {https://doi.org/10.1109/QRS-C.2018.00048},
researchr = {https://researchr.org/publication/LanTGZLR18},
cites = {0},
citedby = {0},
pages = {215-220},
booktitle = {2018 IEEE International Conference on Software Quality, Reliability and Security Companion, QRS Companion 2018, Lisbon, Portugal, July 16-20, 2018},
publisher = {IEEE},
isbn = {978-1-5386-7839-8},
}