Riccardo Lanari, Gianfranco Fornaro, Daniele Riccio, Maurizio Migliaccio, Konstantinos P. Papathanassiou, João R. Moreira, Marcus Schwäbisch, Luciano Dutra, Giuseppe Puglisi, Giorgio Franceschetti, Mauro Coltelli. Generation of digital elevation models by using SIR-C/X-SAR multifrequency two-pass interferometry: the Etna case study. IEEE T. Geoscience and Remote Sensing, 34(5):1097-1114, 1996. [doi]
Abstract is missing.