Evelyn Landman, Shai Cohen, Noam Brousard, Raanan Gewirtzman, Inbar Weintrob, Eyal Fayne, Yahel David, Yuval Bonen, Omer Niv, Shai Tzroia, Alex Burlak, J. W. McPherson. Degradation Monitoring - from a Vision to Reality. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-4, IEEE, 2019. [doi]
@inproceedings{LandmanCBGWFDBN19,
title = {Degradation Monitoring - from a Vision to Reality},
author = {Evelyn Landman and Shai Cohen and Noam Brousard and Raanan Gewirtzman and Inbar Weintrob and Eyal Fayne and Yahel David and Yuval Bonen and Omer Niv and Shai Tzroia and Alex Burlak and J. W. McPherson},
year = {2019},
doi = {10.1109/IRPS.2019.8720527},
url = {https://doi.org/10.1109/IRPS.2019.8720527},
researchr = {https://researchr.org/publication/LandmanCBGWFDBN19},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019},
publisher = {IEEE},
isbn = {978-1-5386-9504-3},
}